The report contains ten-year analysis with the following sections
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camtek | 342 |
dow global technologies | 7 |
printar | 5 |
kammte company | 2 |
kamtec. company | 2 |
sela semiconductor engineering lab… 🛈 | 2 |
nissany, itzik | 2 |
camtek ltd [ | 1 |
camtel | 1 |
commercial agencies | 1 |
camtek | 53 |
printar | 3 |
kamu te company | 1 |
nissany, itzik | 1 |
camtek | 8 |
Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
advanced inspection method utilizing short pulses led illumination | 11 | 2010 |
an inspection system and a method for inspecting a diced wafer | 11 | 2005 |
surface pretreatment and drop spreading control on multi component surfaces | 10 | 2013 |
method and system for preparing a sample | 8 | 2010 |
method and system for preparing a lamella | 8 | 2010 |
wafer inspection system and a method for translating wafers | 8 | 2005 |
process control and manufacturing method for fan out wafers | 8 | 2010 |
systems and method for imaging multiple sides of objects | 8 | 2008 |
composite structure for exterior insulation applications | 8 | 2008 |
method and system for controlling a manufacturing process | 7 | 2007 |