The report contains ten-year analysis with the following sections
contact us for pricing
Check out our sample pages |
Many companies now available
Search to find companies of interest
read summary of their published patent
the company report contains more information
fei company | 2298 |
dcg systems | 8 |
nanofactory instruments | 4 |
till i.d. | 4 |
warsaw orthopedic | 3 |
aspex | 3 |
fei efa | 2 |
fei co. (us) | 2 |
framatome connectors int | 1 |
nanofactory instr | 1 |
fei company | 151 |
warsaw orthopedic | 3 |
till i.d. | 1 |
fei company | 129 |
fei efa | 1 |
dcg systems | 1 |
Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
method for creating s/tem sample and sample structure | 44 | 2006 |
charged-particle microscopy imaging method | 32 | 2011 |
compact scanning electron microscope | 29 | 2006 |
a method and system for spectrum data analysis | 20 | 2008 |
high voltage isolation of an inductively coupled plasma ion source with a liquid that is… 🛈 | 20 | 2009 |
method and apparatus for laser machining | 18 | 2008 |
measurement and endpointing of sample thickness | 17 | 2008 |
image data processing | 17 | 2008 |
method for preparing thin samples for tem imaging | 17 | 2011 |
aberration-corrected wien exb mass filter with removal of neutrals from the beam | 16 | 2011 |