The report contains ten-year analysis with the following sections
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king yuan electronics company | 684 |
jingyuan electronic company | 3 |
king juan electronics company | 1 |
king yuan electronics company | 16 |
Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
method and apparatus for improving yield ratio of testing | 6 | 2009 |
self-cleaning package testing socket | 6 | 2009 |
automatic detecting device for radio frequency environment | 6 | 2008 |
hard and wear-resisting probe and manufacturing method thereof | 5 | 2011 |
semiconductor test system with self-inspection of electrical channel | 5 | 2009 |
segregating apparatus | 5 | 2008 |
semiconductor test system with self-inspection of memory repair analysis | 5 | 2009 |
semiconductor test system with self-inspection of electrical channel for pogo tower | 5 | 2009 |
method for disposing power/ground plane of pcb | 5 | 2008 |
comparison device and method for comparing test pattern files of a wafer tester | 5 | 2010 |