The report contains ten-year analysis with the following sections
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Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
double pass interferometric encoder system | 27 | 2011 |
scan error correction in low coherence scanning interferometry | 24 | 2008 |
interferometric encoder systems | 19 | 2010 |
optical evaluation of lenses and lens molds | 16 | 2014 |
methods and systems for interferometric analysis of surfaces and related applications | 16 | 2003 |
phase-shifting interferometry in the presence of vibration | 15 | 2008 |
measuring topography of aspheric and other non-flat surfaces | 15 | 2014 |
interferometer for determining characteristics of an object surface | 15 | 2005 |
equal-path interferometer | 13 | 2009 |
analyzing surface structure using scanning interferometry | 10 | 2007 |