The report contains ten-year analysis with the following sections
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Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
multi-stage test response compactors | 21 | 2006 |
continuous application and decompression of test patterns to a circuit-under-test | 17 | 1999 |
efficient sense command generation | 15 | 2007 |
integrated circuit layout design methodology with process variation bands | 14 | 2004 |
design for manufacturability | 13 | 2003 |
incremental analysis of layout design data | 11 | 2007 |
method and apparatus for selectively compacting test responses | 11 | 1999 |
cloud services platform | 11 | 2013 |
fragmentation point and simulation site adjustment for resolution enhancement techniques | 11 | 2004 |
calculation system for inverse masks | 10 | 2005 |