The report contains ten-year analysis with the following sections
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hioki ee corporation | 959 |
hioki denki | 31 |
fuji machine manufacturing company | 12 |
zuken | 7 |
hioki electric works | 4 |
ydc corporation | 3 |
keirex technology | 3 |
hioko denki | 1 |
hioki ee corporation | 105 |
hioki denki | 2 |
Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
multimeter | 9 | 2012 |
information administration system | 9 | 2012 |
probe unit, circuit board inspection device, and manufacturing method for probe units | 8 | 2012 |
manufacturing device, manufacturing management system and manufacturing control program | 8 | 2013 |
probe unit, substrate inspection device, and method for assembling probe unit | 8 | 2013 |
voltage detecting apparatus and line voltage detecting apparatus having a detection elec… 🛈 | 7 | 2008 |
voltage detection device | 6 | 2009 |
probe unit, circuit board inspection device and probe unit manufacturing method | 6 | 2011 |
probe unit and substrate inspection device | 5 | 2013 |
substrate manufacturing apparatus, substrate manufacturing method, ball-mounted substrat… 🛈 | 4 | 2009 |