The report contains ten-year analysis with the following sections
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rigaku corporation | 56 |
Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
x-ray fluorescence spectrometer | 18 | 2015 |
surface microstructure measuring method, surface microstructure measurement data analyzi… 🛈 | 13 | 2009 |
fluorescent x-ray analysis device and method | 12 | 2010 |
x-ray diffraction apparatus and x-ray diffraction method | 12 | 2007 |
x-ray apparatus, method of using the same and x-ray irradiation method | 12 | 2009 |
x-ray optical component device and x-ray analyzer | 11 | 2013 |
x-ray diffraction method and portable x-ray diffraction apparatus using same | 11 | 2010 |
wavelength-classifying type x-ray diffraction device | 11 | 2010 |
radiation detector, and x-ray analysis apparatus and radiation detection method using th… 🛈 | 10 | 2013 |
correction information generation method and correction information generation apparatus | 10 | 2013 |