The report contains ten-year analysis with the following sections
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Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
method of fabricating goi silicon wafer, goi silicon wafer and goi detection method | 4 | 2013 |
method for manufacturing insulated gate bipolar transistor igbt | 4 | 2013 |
method for manufacturing oxide layer | 4 | 2012 |
integrated device, manufacturing method thereof, discrete device, and cdmos (complementa… 🛈 | 3 | 2012 |
method for manufacturing laterally diffused metal oxide semiconductor device | 3 | 2013 |
transistor fabricating method and transistor | 3 | 2013 |
power semiconductor device and method of fabricating the same and cutoff ring | 3 | 2014 |
high-voltage ldmos integrated device | 3 | 2012 |
fabrication method of double layer polysilicon gate | 3 | 2011 |
measurement device and method for well resistor of mos | 2 | 2014 |